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Contact static AFM
Lateral force microscopy /with contact static AFM/
Non-contact dynamic AFM
Intermittent contact AFM (similar to Tapping Mode®)
Phase contrast imaging /with intermittent contact AFM/
Two-pass mode (for static and dynamic AFM)
Two-pass mode with varying separation (for static and dynamic AFM) /Original technique!/
Multicycle scanning (for static and dynamic AFM) /Original technique!/
Multilayer scanning with varying load (for static and dynamic AFM) /Original technique!/
Electrostatic force microscopy (two-pass technique) *, **
Current mode *, **
Magnetic force microscopy (two-pass technique) *, **
Static force spectroscopy (with calculation of quantitative parameters, surface energy and elastic modulus in the measurement point)
Dynamic force spectroscopy
Dynamic frequency force spectroscopy /Original technique!/
Nanoindentation *
Nanoscratching *
Linear nanowear *
Nanolithography (with control of load, depth and bias voltage) *
Microtribometry * /Original technique!/
Microadhesiometry * /Original technique!/
Shear-force microtribometry * /Original technique!/
Temperature-dependent measurements (under all above modes) *
| 仪器分类: | AFM |
Measurement modes:
Motion patterns at the measurements: | Note. |
Scan field area: | from 5x5 micron up to 50x40 microns |
Maximum range of measured heights: | from 2 to 4 micron |
Lateral resolution (plane XY): | 1–5 nm (depending on sample hardness) |
Vertical resolution (direction Z): | 0.1–0.5 nm (depending on sample hardness) |
Scanning matrix: | Up to 1024x1024 points |
Scan rate: | 40–250 points per second in X-Y plane |
Nonlinearity correction : | A software nonlinearity correction provided |
Minimum scanning step: | 0.3 nm |
Scanning scheme: | The sample is moved in X-Y plane (horizontal) and in Z-direction (vertical) under stationary probe. |
Scanner type: | A piezoceramic tube. |
Cantilevers (probes): | Commercial AFM cantilevers of 3.4x1.6x0.4 mm. |
Cantilever deflection detection system: | Laser beam scheme with four-quadrant position-sensitive photodetector |
Sample size: | Up to 30x30x8 mm (w–d–h); extending block insert allows measurement of samples with height up to 35 mm |
High voltage amplifier output: | +190 V |
ADC: | 16 bit |
Operation environment: | Open air, 760+40 mm Hg col., T = 22+4°С, relative humidity <70% |
Range of automated movement of measuring head: | 10x10 mm in XY plane for micropositioning of probe relative measured sample at step 2.5 micron with optical visual monitoring |
Overall dimensions: | Scanning unit: 185x185x290 mm |
Field of view of embedded videosystem: | 1x0.75 mm, visualization window 640x480 pixel, frame rate up to 30 fps. |
Vibration isolation: | Additional antivibration table is recommended |
Host computer: | Not less than: Celeron® 2.2, RAM 256 MB, HDD 80 GB, VRAM 128 MB, monitor 17" 1024x768x32 bit, Windows® XP SP1, 2 USB port. |
Software: | Special control software SurfaceScan and the AFM image processing package SurfaceView / SurfaceXplorer are included. |
可进行纳米压痕、划痕、磨损测试
性价比好
- 产品分类
- 品牌分类
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仪企号
北京伯英科技有限公司
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友情链接
