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技术资料
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Insulator analysis using combined FIB-SEM instrument with TOF-SIMS
发布：泰思肯贸易（上海）有限公司浏览次数：882The development of a Time of Flight Secondary Ion Mass Spectrometer (TOF-SIMS) that can be
attached to a FIB-SEM instrument provides an analyzer that very well complements the standard EDS detector. However, contrary to EDS, it gives much better depth resolution, possibility of depth profiling as well as distinguishing isotopes.
2021-05-21上一篇：Nanoscale chemical mapping of Li-ion battery cathode material by FIB-SEM and TOF-SIMS
下一篇：High Spatial Resolution Time-of-Flight Secondary Ion Mass Spectrometry for the Masses相关仪器 -
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