-
技术资料
-
Nanoscale chemical mapping of Li-ion battery cathode material by FIB-SEM and TOF-SIMS
发布:泰思肯贸易(上海)有限公司浏览次数:894Nanoscale mapping is achieved by multi-modal correlative microscopy combining focused ion beam and scanning electron microscopy (FIB-SEM) with Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS).Mapping Li, Mn and Co nanoscale distributions reveals the micro-structural consequences of the electrochemical reaction, and allows identifying Li “trapping” sites within the structure
2021-05-21上一篇:TESCAN LYRA3 FIB-SEM with integrated TOF-SIMS analyser
下一篇:Insulator analysis using combined FIB-SEM instrument with TOF-SIMS相关仪器 -
免责声明
①本网刊载上述内容,并不代表本网赞同其观点或证实其内容的真实性,不承担此类作品侵权行为的直接责任及连带责任
②若本站内容侵犯到您的合法权益,请及时告诉,我们马上修改或删除。邮箱:hezou_yiqi
-
仪网通银牌会员 第 4 年
泰思肯贸易(上海)有限公司
认证:工商信息已核实
- 产品分类
- 品牌分类
-
仪企号泰思肯贸易(上海)有限公司
-
友情链接
-
手机版开启全新的世界m.yiqi.com/zt2179/