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解决方案
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The physical-chemical model of the tip-induced oxida
发布:上海纳腾仪器有限公司浏览次数:408In a last decade the surface local modification methods by scanning probe microscope actively have developed. There are several ways of the surface properties modification in a nanometer scale by AFM or STM means like, by mechanical scratching or by voltage impulses applying on a tip. The wide practical applications of probe lithography have been found based on anodization of a surface accelerated by the cantilever tip. The method of tip-induced oxidation of a metal and semiconductor surfaces starts to be used even for nanoelectronic devices creation [1,5]. 高性价比-多功能扫描探针显微镜(SPM)-原子力显微镜(AFM)
2009-06-18相关仪器 -
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