详细介绍
M5512 GDDR7 Memory Test System
ATE-on-Bench for GDDR7 Characterization and Test
BENEFITS
Fastest time to market: perform deep memory read/write operations and characterize electrical and timing specifications
Most capable PAM3 signaling: leveraging years of expertise in SerDes technology, the PAM3 pin-electronics exceed the requirements of the GDDR7 specifications
Automated: scripting capability ideal for debug tasks, verification, and full‐fledged production screening of devices and system boards
M5512 GDDR7内存测试系统
用于GDDR7表征和测试的台架ATE
利益
上市时间：执行深度内存读/写操作，并确定电气和时序规格
强大的PAM3信号：利用SerDes技术多年的专业知识，PAM3引脚电子器件超过了GDDR7规范的要求
自动化：脚本功能非常适合调试任务、验证以及设备和系统板的全面生产筛选
深圳市锐测电子科技（Reetest）专注于提供针对各种芯片总线接口协议/Serdes/器件/系统级产品从物理层至协议层的测试解决方案，覆盖R&D测试验证，RDT可靠性测试，芯片量产测试, AE/FAE等各个产品生命周期的测试。公司针对每一个产品线均有配备非常专业且富有经验的技术支持工程师提供local的产品售前售后技术支持服务。
产品优势
M5512 GDDR7 Memory Test System
ATE-on-Bench for GDDR7 Characterization and Test
ATE-on-Bench for GDDR7 Characterization and Test
